SUHIR, E. Failure-oriented-accelerated-testing (FOAT) and its role in assuring electronics reliability: review. International Journal of Physics Research and Applications, [S. l.], v. 6, n. 1, p. 001–018, 2023. DOI: 10.29328/journal.ijpra.1001048. Disponível em: https://www.physicsresjournal.com/ijpra/article/view/ijpra-aid1048. Acesso em: 25 apr. 2025.